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Active standard | Published: 03/08/2022
BS ISO 23170:2022
Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering.
Available languages: English
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Detail information
Designation: BS ISO 23170:2022
Publication date: 03/08/2022
Pages: 38
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 14473 4 Status: DefinitivePopular Publishers
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