Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Active standard | Published: 01/03/2025
GOST R 71334-2024
Epitaxial structures. Method for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
from 46.60 EUR
show on eshop
Detail information
Designation: GOST R 71334-2024
Publication date: 01/03/2025
Pages: 8
Country: Russian technical standard
Where to buy?
You can buy at www.mystandards.bizPopular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
