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Active standard | Published: 19/05/2010
IEC 62415-ed.1.0
Semiconductor devices - Constant current electromigration test
(Dispositifs a semiconducteurs - Essai d´electromigration en courant constant)
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
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Detail information
Designation: IEC 62415-ed.1.0
Publication date: 19/05/2010
Pages: 22
Country: International technical standard
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You can buy at www.mystandards.bizAnotation
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts. La CEI 62415:2010 decrit une methode pour des essais conventionnels delectromigration en courant constant de lignes metalliques, de chaines de trous de liaison et de contacts de trous de liaison.Popular Publishers
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