Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Active standard | Published: 09/07/2010
ISO 14237:2010-ed.2.0
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials
(Analyse chimique des surfaces — Spectrométrie de masse des ions secondaires — Dosage des atomes de bore dans le silicium a l´aide de matériaux dopés uniformément)
Available languages: English, French
Available design: electronic design (pdf), Print design
from 201.80 USD
show on eshop
Detail information
Designation: ISO 14237:2010-ed.2.0
Publication date: 09/07/2010
Pages: 19
Country: International technical standard
Where to buy?
You can buy at www.mystandards.bizPopular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
