Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Active standard | Published: 15/07/2003
ISO 6342:2003-ed.2.0
Micrographics — Aperture cards — Method of measuring thickness of buildup area
(Micrographie — Cartes a fenetre — Méthode de mesurage de la zone de surépaisseur)
Available languages: English
Available design: electronic design (pdf), Print design
from 56.20 EUR
show on eshop
Detail information
Designation: ISO 6342:2003-ed.2.0
Publication date: 15/07/2003
Pages: 3
Country: International technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Description / Abstract: ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.Popular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
