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Active standard | Published: 20/02/2014
JIS C5402-16-1:2014
Connectors for electronic equipment -- Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations -- Test 16a: Probe damage
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 116.40 USD
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Detail information
Designation: JIS C5402-16-1:2014
Publication date: 20/02/2014
Pages: 6
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