ASTM F1393-92(1997) Neplatná

Podrobné informace

Označení: ASTM F1393-92(1997)

Datum vydání: 01.01.1992

Stran: 7

Poznámka: Neplatná

Země: Americká technická norma

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Můžete zakoupit na eshop.normservis.cz

Anotace

Keywords:
Density-electronic applications, Depth profiling, Diodes, Electrical conductors-semiconductors, Mercury probe, Miller feedback profiler, Net carrier density (in semiconductors), Polished silicon wafers/slices, Probe methods, Resistance and resistivity (electrical)-semiconductors, Schottky barrier diode, Silicon-semiconductor applications, Single-crystal silicon, Voltage, net carrier density profiles in epitaxial/polished bulk silicon wafers,