IEC - International electro-technical commission

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Available languages: English

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Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 4: Essai continu fortement accelere de contrainte de chaleur humide (HAST))

Available languages: English, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
(Dispositifs a semiconducteurs - Methodes d´essais climatiques et mecaniques - Partie 40: Methode d´essai de chute au niveau de la carte avec utilisation d´une jauge de contrainte)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 41: Methodes d’essai normalisees pour la fiabilite des dispositifs a memoire non volatile)

Available languages: English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 42: Stockage de temperature et d´humidite)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 44: Methode d´essai des effets d´un evenement isole (SEE) irradie par un faisceau de neutrons pour des dispositifs a semiconducteurs)

Available languages: English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 5: Essai continu de duree de vie sous temperature et humidite avec polarisation)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 6: Stockage a haute temperature)

Available languages: English, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 7: Mesure de la teneur en humidite interne et analyse des autres gaz residuels)

Available languages: English, French, English and French

Available design: electronic design (pdf), Print design, CD-ROM