JIS - Japanese technical standards

Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Vocabulary -- Part 1: General terms and terms used in spectroscopy

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Available languages: Japanese

Available design: electronic design (pdf), Print design

Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry

Available languages: Japanese

Available design: electronic design (pdf), Print design

Non-dispersive infrared gas analyzer

Available languages: English, Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Available languages: Japanese

Available design: electronic design (pdf), Print design