JIS - Japanese technical standards

Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis-Secondary ion mass spectrometry-Linearity of intensity scale in single ion counting time-of-flight mass analysers

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis-Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

Available languages: Japanese

Available design: electronic design (pdf), Print design