STN - Slovak standards

Semiconductor devices - Mechanical and climatic test methods Part 33: Accelerated moisture resistance - Unbiased autoclave

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Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 34: Periodické výkonové zaťaženie (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module

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Available design: Print design

Semiconductor devices - Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components

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Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state

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Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

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Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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Available design: Print design

Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 40: Skúšobná metóda pádom osadenej dosky s použitím tenzometra (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

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Available design: Print design