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STN EN IEC 60749-26 (1.2.2019)

STN EN IEC 60749-26 (01/02/2019)

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Available languages: English

Available design: Print design

STN EN IEC 60749-26 (1.5.2026)

STN EN IEC 60749-26 (01/05/2026)

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Available languages: English

Available design: Print design

STN EN 60749-27 (1.5.2007)

STN EN 60749-27 (01/05/2007)

Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Available languages: English

Available design: Print design

STN EN 60749-27:2007/A1 (1.4.2013)

STN EN 60749-27:2007/A1 (01/04/2013) Change

Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Available languages: English

Available design: Print design

STN EN IEC 60749-28 (1.7.2022)

STN EN IEC 60749-28 (01/07/2022)

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

Available languages: English

Available design: Print design

STN EN 60749-29 (1.12.2011)

STN EN 60749-29 (01/12/2011)

Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 29: Skúška latch-up (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

STN EN IEC 60749-30 (1.1.2021)

STN EN IEC 60749-30 (01/01/2021)

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Available languages: English

Available design: Print design

STN EN 60749-31 (1.1.2004)

STN EN 60749-31 (01/01/2004)

Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)

Available languages: English

Available design: Print design

STN EN 60749-32 (1.1.2004)

STN EN 60749-32 (01/01/2004)

Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)

Available languages: English

Available design: Print design

STN EN 60749-32:2004/A1 (1.12.2010)

STN EN 60749-32:2004/A1 (01/12/2010) Change

Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)

Available languages: English

Available design: Print design

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