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BS - British national standards
Page 4015
BS EN 62047-2:2006 (30/11/2006)
Semiconductor devices. Micro-electromechanical devices. Tensile testing method of thin film materials.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.40 USD more info
BS EN 62047-20:2014 (31/10/2014)
Semiconductor devices. Micro-electromechanical devices. Gyroscopes.
Available languages: English
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from 415.90 USD more info
BS EN 62047-21:2014 (31/10/2014)
Semiconductor devices. Micro-electromechanical devices. Test method for Poisson´s ratio of thin film MEMS materials.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.40 USD more info
BS EN 62047-22:2014 (31/10/2014)
Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates.
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.40 USD more info
BS EN 62047-25:2016 (30/11/2016)
Semiconductor devices. Micro-electromechanical devices. Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding area.
Available languages: English
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from 299.60 USD more info
BS EN 62047-26:2016 (31/05/2016)
Semiconductor devices. Micro-electromechanical devices. Description and measurement methods for micro trench and needle structures.
Available languages: English
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from 351.30 USD more info
BS IEC 62047-27:2017 (22/07/2020)
Semiconductor devices. Micro-electromechanical devices. Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT).
Available languages: English
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from 204.20 USD more info
BS IEC 62047-28:2017 (22/07/2020)
Semiconductor devices. Micro-electromechanical devices. Performance testing method of vibration-driven MEMS electret energy harvesting devices.
Available languages: English
Available design: PDF - Immediate download, Print design
from 204.20 USD more info
BS IEC 62047-29:2017 (15/03/2018)
Semiconductor devices. Micro-electromechanical devices. Electromechanical relaxation test method for freestanding conductive thin-films under room temperature.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.40 USD more info
BS EN 62047-3:2006 (30/11/2006)
Semiconductor devices. Micro-electromechanical devices. Thin film standard test piece for tensile testing.
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.40 USD more info
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