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GB - Chinese national standards
Page 4934
GB/T 4937.23-2023 (23/05/2023)
Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 314.60 EUR more info
GB/T 4937.24-2025 (02/12/2025)
Semiconductor devices—Mechanical and climatic test methods—Part 24: Accelerated moisture resistance—Unbiased HAST
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 250.40 EUR more info
GB/T 4937.25-2025 (02/12/2025)
Semiconductor devices—Mechanical and climatic test methods—Part 25: Temperature cycling
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 314.60 EUR more info
GB/T 4937.26-2023 (07/09/2023)
Semiconductor devices—Mechanical and climatic test methods—Part 26: Electrostatic discharge (ESD) sensitivity testing—Human body modelHBM
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 860.40 EUR more info
GB/T 4937.27-2023 (23/05/2023)
Semiconductor devices—Mechanical and climatic test methods—Part 27: Electrostatic discharge(ESD) sensitivity testing—Machine model(MM)
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 293.20 EUR more info
GB/T 4937.28-2026 (27/02/2026)
Semiconductor devices—Mechanical and climate test methods—Part 28: Electrostatic discharge (ESD) sensitivity testing—Charged device model (CDM)—device level
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 999.50 EUR more info
GB/T 4937.29-2025 (02/12/2025)
Semiconductor devices—Mechanical and climatic test methods—Part 29: Latch-up test
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 571.50 EUR more info
GB/T 4937.3-2012 (05/11/2012)
Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 122.00 EUR more info
GB/T 4937.30-2018 (17/09/2018)
Semiconductor devices—Mechanical and climatic test methods—Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 196.90 EUR more info
GB/T 4937.31-2023 (23/05/2023)
Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devicesinternally induced
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 164.80 EUR more info
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