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Polovodičové součástky - Mechanické a klimatické zkoušky - Část 27: Zkoušení citlivosti na elektrostatický výboj (ESD) - Strojový model (MM). (Norma přebírající anglický originál, vlastní text je součástí výtisku).
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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
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Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
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Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
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Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
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Polovodičové součástky - Mechanické a klimatické zkoušky - Část 32: Hořlavost v plastu zapouzdřených součástek (vyvolaná zevně). (Norma přebírající anglický originál, vlastní text je součástí výtisku).
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Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
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Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
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Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
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