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BS - British national standards
Page 4017
BS IEC 62047-40:2021 (14/09/2021)
Semiconductor devices. Micro-electromechanical devices. Test methods of micro-electromechanical inertial shock switch threshold.
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.40 USD more info
BS IEC 62047-41:2021 (28/06/2021)
Semiconductor devices. Micro-electromechanical devices. RF MEMS circulators and isolators.
Available languages: English
Available design: PDF - Immediate download, Print design
from 351.30 USD more info
BS IEC 62047-42:2022 (24/10/2022)
Semiconductor devices. Micro-electromechanical devices. Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever.
Available languages: English
Available design: PDF - Immediate download, Print design
from 299.60 USD more info
BS IEC 62047-43:2024 (22/03/2024)
Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.40 USD more info
BS IEC 62047-44:2024 (29/02/2024)
Semiconductor devices. Micro-electromechanical devices. Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices.
Available languages: English
Available design: PDF - Immediate download, Print design
from 204.20 USD more info
BS IEC 62047-45:2025 (01/04/2025)
Semiconductor devices. Micro-electromechanical devices. Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.40 USD more info
BS IEC 62047-46:2025 (30/04/2025)
Semiconductor devices. Micro-electromechanical devices. Silicon based MEMS fabrication technology. Measurement method of tensile strength of nanoscale thickness membrane.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.40 USD more info
BS IEC 62047-47:2024 (28/08/2024)
Semiconductor devices. Micro-electromechanical devices. Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures.
Available languages: English
Available design: electronic design (pdf), Print design
from 214.40 USD more info
BS IEC 62047-48:2024 (11/06/2024)
Semiconductor devices. Micro-electromechanical devices. Test method for determining solution concentration by optical absorption using MEMS fluidic device.
Available languages: English
Available design: electronic design (pdf), Print design
from 214.40 USD more info
BS IEC 62047-49:2025 (03/12/2025)
Semiconductor devices. Micro-electromechanical devices. Temperature and humidity test methods for piezoelectric MEMS cantilevers.
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.40 USD more info
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